Picture Mfr Part # QUANTITY Inventory MANUFACTURE Description Package Series Part Status Packaging Operating Temperature Mounting Type Package / Case Supplier Device Package Supply Voltage Number of Bits Logic Type
GLOBAL STOCKS
SN74BCT8374ANTG4
RFQ
VIEW
RFQ
1,666
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ANT
RFQ
VIEW
RFQ
1,188
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWRE4
RFQ
VIEW
RFQ
3,317
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWR
RFQ
VIEW
RFQ
3,250
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWRG4
RFQ
VIEW
RFQ
3,978
In-stock
Texas Instruments IC SCAN TEST DEVICE 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADW
RFQ
VIEW
RFQ
889
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Active Tube 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops