- Series :
- Part Status :
- Packaging :
- Supply Voltage :
- Logic Type :
-
- ABT Scan Test Device With Transceivers and Registers (5)
- ABT Scan Test Device With Universal Bus Transceivers (17)
- Linking Addressable Scan Ports (1)
- Scan Test Device with Registered Bus Transceiver (2)
- Scan Test Device With Transceivers And Registers (6)
- Scan Test Device with Universal Bus Transceivers (4)
- Applied Filters :
35 results
Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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GLOBAL STOCKS | |||||||||||||||||
VIEW |
3,479
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
2,075
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
VIEW |
3,173
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
VIEW |
2,859
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
VIEW |
3,739
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
VIEW |
728
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
2,042
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
737
In-stock
|
Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
930
In-stock
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Texas Instruments | IC 18BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
2,710
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
VIEW |
1,147
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
VIEW |
2,889
In-stock
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
3,889
In-stock
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Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
3,212
In-stock
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Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
1,771
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
VIEW |
3,544
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
2,346
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
3,989
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
1,253
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
1,851
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
VIEW |
1,952
In-stock
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
VIEW |
854
In-stock
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Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
VIEW |
3,631
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
VIEW |
722
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
VIEW |
2,133
In-stock
|
Texas Instruments | IC LINK ADDRSS SCAN-PORT 64-LQFP | 74LVT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | - | Linking Addressable Scan Ports | ||||
VIEW |
1,601
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
3,042
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
3,851
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
1,437
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
VIEW |
2,170
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers |